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National Semiconductor Introduces Industry’s Most Cost-Effective Universal Boundary SCAN Buffer/Transceiver

Ideal for Low-Voltage Telecom and Datacom Systems, National’s New SCAN16602 and SCAN16512 Provide JTAG Test Access for Enhanced Board or System Test Coverage

Jun 9, 2003

June 9, 2003 - National Semiconductor Corporation (NYSE:NSM) today announced two new integrated circuits designed to provide easy, cost-effective testability in base stations, switchers, multiplexers and other low-voltage telecommunications systems.

National’s new SCAN16602 and SCAN16512 are the latest products in a family of high-performance chips that enable testability of boards or entire systems.

Buffers similar to the SCAN16602 and SCAN16512 are used in many new telecom designs – they are effective for interfacing components to busses or to each other. However, in the past designers may not have used SCAN/JTAG compliant buffers due to the cost – typically three to 10 times the cost of a non-JTAG (Joint Test Action Group) buffer. With the introduction of the SCAN16602 and the SCAN16512 devices, designers can now choose to use JTAG compliant buffers without paying a price penalty.

“The SCAN16602 and SCAN16512 extend National’s lead in high-performance I/O and JTAG-enabled integrated circuits,” said Brian Stearns, marketing manager, Enhanced Solutions Product Group, National Semiconductor. “With these new chips, our customers can create systems with built-in test features that dramatically lower the total cost of ownership.”

Features and Benefits
The SCAN16602 and SCAN16512 are high-speed, low-power universal 16-bit transceivers with industry-standard IEEE 1149.1 test access. The data inputs are organized into two 8-bit bytes with separate output enable and direction control signals. These functions can be configured as a D-type latch or flip-flop, and can operate in transparent, latched or clocked mode. These devices can replace the functionality in many other transceiver products, which saves costs and reduces the need to stock several different types of device.

The SCAN16602 and SCAN16512 are designed for inserting test points into high-speed TTL/CMOS backplanes and operate over a supply voltage range of 2.7 to 3.6 volts. Optional bus hold or series resistors on the SCAN16602 and SCAN16512 eliminate the need for additional pull-up/down or external termination resistors while minimizing system noise. High-performance BGA packaging minimizes the board space needed when using these functions. The SCAN16602 is ideal for telecom and datacom equipment manufacturers of base stations, switches and multiplexers.

Pricing and Availability
National’s SCAN16602 and SCAN16512 are available in 64-bump BGA packaging at $3.25 each in 1000-unit quantities. More information is available at: http://www.national.com/scan

About National Semiconductor
National Semiconductor is the premier analog company driving the information age. Combining real-world analog and state-of-the-art digital technology, the company is focused on analog-based semiconductor products, which include stand-alone devices and subsystems in the areas of power management, imaging, display drivers, audio, amplifiers and data conversion. The company targets key markets such as wireless, displays, PC and networking and a broad range of portable applications. With headquarters in Santa Clara, California, National reported sales of $1.67 billion for its most recent fiscal year. Additional company and product information is available on the World Wide Web at www.national.com

NOTE TO EDITORS: The IEEE 1149.1 Standard for Boundary Scan Test defines a digital Test Access Port (TAP) and protocol that can be used to read or write to the digital I/Os of compliant devices. Initially this supported structural test of printed circuit boards. Now its use has been expanded to support in-system configuration, programming, and emulation. It is a powerful, well-supported industry standard that significantly enhances electronic systems through all phases of their lifecycle.